Dean Lewis
According to our database1,
Dean Lewis
authored at least 54 papers
between 2000 and 2015.
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Collaborative distances:
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Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2015
Microelectron. Reliab., 2015
2014
Microelectron. Reliab., 2014
2013
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell.
Microelectron. Reliab., 2013
Characterization and modeling of laser-induced single-event burn-out in SiC power diodes.
Microelectron. Reliab., 2013
2012
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology.
Microelectron. Reliab., 2012
Microelectron. Reliab., 2012
2011
Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory.
Microelectron. Reliab., 2011
Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization.
Microelectron. Reliab., 2011
LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis.
Microelectron. Reliab., 2011
Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis.
Microelectron. Reliab., 2011
2010
Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations.
Microelectron. Reliab., 2010
Microelectron. Reliab., 2010
Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below).
Microelectron. Reliab., 2010
2009
Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package.
Microelectron. Reliab., 2009
Microelectron. Reliab., 2009
Microelectron. Reliab., 2009
2008
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs.
Microelectron. Reliab., 2008
Microelectron. Reliab., 2008
Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008
2007
Identification of process/design issues during 0.18 µm technology qualification for space application.
Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007
2006
Microelectron. Reliab., 2006
Microelectron. Reliab., 2006
2005
Microelectron. Reliab., 2005
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.
Microelectron. Reliab., 2005
Microelectron. Reliab., 2005
Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005
2004
Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC.
IEEE Trans. Instrum. Meas., 2004
Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?
Microelectron. Reliab., 2004
Microelectron. Reliab., 2004
Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections.
Microelectron. Reliab., 2004
Microelectron. Reliab., 2004
2003
Microelectron. Reliab., 2003
Microelectron. Reliab., 2003
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.
Microelectron. Reliab., 2003
Microelectron. Reliab., 2003
Microelectron. Reliab., 2003
Microelectron. Reliab., 2003
2002
Microelectron. Reliab., 2002
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.
Microelectron. Reliab., 2002
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices.
Microelectron. Reliab., 2002
Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser.
Proceedings of the 3rd Latin American Test Workshop, 2002
2001
Microelectron. Reliab., 2001
Microelectron. Reliab., 2001
Proceedings of the 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 2001
2000
Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000