Davide Medina

According to our database, Davide Medina authored at least 6 papers between 1990 and 1998.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

1998

Integrating Online and Offline Testing of a Switching Memory.

Stefano Barbagallo, Davide Medina, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda

IEEE Des. Test Comput., 1998

1996

Scan insertion criteria for low design impact.

Stefano Barbagallo, Monica Lobetti Bodoni, Davide Medina, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

A Parametric Design of a Built-in Self-Test FIFO Embedded Memory.

Stefano Barbagallo, Monica Lobetti Bodoni, Davide Medina, Gabriel de Blasio, M. Ferloni, Franco Fummi, Donatella Sciuto

Proceedings of the 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1996

1995

Industrial BIST of Embedded RAMs.

Paolo Camurati, Paolo Prinetto, Matteo Sonza Reorda, Stefano Barbagallo, Andrea Burri, Davide Medina

IEEE Des. Test Comput., 1995

1994

An industrial experience in the built-in self test of embedded RAMs.

Paolo Camurati, Paolo Prinetto, Matteo Sonza Reorda, Stefano Barbagallo, Andrea Burri, Davide Medina

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

1990

A diagnostic test pattern generation algorithm.

Paolo Camurati, Davide Medina, Paolo Prinetto, Matteo Sonza Reorda

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990