Davide Bianchi
Orcid: 0000-0003-0635-0637
According to our database1,
Davide Bianchi
authored at least 24 papers
between 2014 and 2024.
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Book In proceedings Article PhD thesis Dataset OtherLinks
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Bibliography
2024
Effectiveness of Management Zones Delineated from UAV and Sentinel-2 Data for Precision Viticulture Applications.
Remote. Sens., February, 2024
Asymptotic spectra of large (grid) graphs with a uniform local structure, Part II: Numerical applications.
J. Comput. Appl. Math., February, 2024
CoRR, 2024
2023
Convergence analysis and parameter estimation for the iterated Arnoldi-Tikhonov method.
CoRR, 2023
Proceedings of the Scale Space and Variational Methods in Computer Vision, 2023
2022
Uniformly convex neural networks and non-stationary iterated network Tikhonov (iNETT) method.
CoRR, 2022
2021
CoRR, 2021
Proceedings of the 2021 21st International Conference on Computational Science and Its Applications (ICCSA), Cagliari, Italy, September 13-16, 2021, 2021
2020
Analysis of the spectral symbol associated to discretization schemes of linear self-adjoint differential operators.
CoRR, 2020
CoRR, 2020
2019
Analysis of the spectral symbol function for spectral approximation of a differential operator.
CoRR, 2019
2017
Methods for atomistic abrasion simulations of laterally periodic polycrystalline substrates with fractal surfaces.
Comput. Phys. Commun., 2017
A Bibliometric Framework to Identify and Delineate Subfields of Research on Tribological Wear - Part One: Can We Identify Fundamental Issues by Clusters of Similar Journals?
Proceedings of the Everything Changes, 2017
2016
IEEE Trans. Circuits Syst. II Express Briefs, 2016
Regularization Preconditioners for Frame-Based Image Deblurring with Reduced Boundary Artifacts.
SIAM J. Sci. Comput., 2016
2014
Integrated instrumentation for high sensitivity impedance measurements on nanosamples.
PhD thesis, 2014
CMOS Impedance Analyzer for Nanosamples Investigation Operating up to 150 MHz With Sub-aF Resolution.
IEEE J. Solid State Circuits, 2014
An analysis method for atomistic abrasion simulations featuring rough surfaces and multiple abrasive particles.
Comput. Phys. Commun., 2014
17.4 CMOS impedance analyzer for nanosamples investigation operating up to 150MHz with Sub-aF resolution.
Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014