David Z. Gao
Orcid: 0000-0002-9720-7627
According to our database1,
David Z. Gao
authored at least 6 papers
between 2015 and 2022.
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Bibliography
2022
Combining measurements and modeling/simulations analysis to assess carbon nanotube memory cell characteristics.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2020
Comput. Phys. Commun., 2020
2018
Role of electron and hole trapping in the degradation and breakdown of SiO2 and HfO2 films.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2015
J. Comput. Chem., 2015