David R. Lakin II

According to our database, David R. Lakin II authored at least 2 papers between 1998 and 1999.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

1999

Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study.

David R. Lakin II, Adit D. Singh

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Binning for IC Quality: Experimental Studies on the SEMATECH Data.

Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh

Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998