David Maier

According to our database, David Maier authored at least 1 paper in 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2012

Reliability investigation of the degradation of the surface passivation of InAlN/GaN HEMTs using a dual gate structure.

Clemens Ostermaier, Peter Lagger, Mohammed Alomari, Patrick Herfurth, David Maier, Alexander Alexewicz, Marie-Antoinette di Forte-Poisson, Sylvain L. Delage, Gottfried Strasser, Dionyz Pogany, Erhard Kohn

Microelectron. Reliab., 2012