David E. Lackey
According to our database1,
David E. Lackey
authored at least 10 papers
between 1996 and 2010.
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Bibliography
2010
Low cost at-speed testing using On-Product Clock Generation compatible with test compression.
Proceedings of the 2011 IEEE International Test Conference, 2010
2007
An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs.
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007
Variation-aware performance verification using at-speed structural test and statistical timing.
Proceedings of the 2007 International Conference on Computer-Aided Design, 2007
2006
Proceedings of the 2006 IEEE International Test Conference, 2006
2003
Proceedings of the 40th Design Automation Conference, 2003
Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003
2002
IBM J. Res. Dev., 2002
Proceedings of the 2002 IEEE/ACM International Conference on Computer-aided Design, 2002
2000
Proceedings of the IEEE 2000 Custom Integrated Circuits Conference, 2000
1996