David Beil
Orcid: 0000-0002-6425-7919Timeline
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Bibliography
2020
Cluster-clean-label: an interactive machine learning approach for labeling high-dimensional data.
Proceedings of the VINCI 2020: The 13th International Symposium on Visual Information Communication and Interaction, 2020
Development of a Machine Learning Based Algorithm To Accurately Detect Schizophrenia based on One-minute EEG Recordings.
Proceedings of the 53rd Hawaii International Conference on System Sciences, 2020