David B. Shu

According to our database, David B. Shu authored at least 10 papers between 1985 and 1993.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

1993

Heterogeneous Algorithms for Image Understanding Architecture.

Mary Mehrnoosh Eshaghian, J. Greg Nash, Muhammad E. Shaaban, David B. Shu

Parallel Algorithms Appl., 1993

1991

Parallel Implementation of Image Understanding Tasks on Gated-Connection Networks.

David B. Shu, J. Greg Nash, K. Kim

Proceedings of the Fifth International Parallel Processing Symposium, Proceedings, Anaheim, California, USA, April 30, 1991

1990

An overview of architecture research for image understanding at the University of Massachusetts.

Charles C. Weems, Deepak Rana, Allen R. Hanson, Edward M. Riseman, David B. Shu, J. Gregory Nash

Proceedings of the 10th IAPR International Conference on Pattern Recognition, 1990

Straight-line detection on a gated-connection VLSI network.

David B. Shu, J. Gregory Nash, Mary Mehrnoosh Eshaghian, K. Kim

Proceedings of the 10th IAPR International Conference on Pattern Recognition, 1990

Routing on the CAAPP.

Martin C. Herbordt, Charles C. Weems, David B. Shu

Proceedings of the 10th IAPR International Conference on Pattern Recognition, 1990

A multiple-level heterogeneous architecture for image understanding.

David B. Shu, J. Gregory Nash, Charles C. Weems

Proceedings of the Application Specific Array Processors, 1990

1989

The image understanding architecture.

Charles C. Weems, Steven P. Levitan, Allen R. Hanson, Edward M. Riseman, David B. Shu, J. Gregory Nash

Int. J. Comput. Vis., 1989

1988

A Line Extraction Method for Automated SEM Inspection of VLSI Resist.

David B. Shu, Ching-Chung Li, J. F. Mancuso, Yung-Nien Sun

IEEE Trans. Pattern Anal. Mach. Intell., 1988

1986

An approach to 3-D object identification using range images.

David B. Shu, Ching-Chung Li, Yung-Nien Sun

Proceedings of the 1986 IEEE International Conference on Robotics and Automation, 1986

1985

A preliminary study of automated inspection of VLSI resist patterns.

Ching-Chung Li, J. F. Mancuso, David B. Shu, Yung-Nien Sun, L. D. Roth

Proceedings of the 1985 IEEE International Conference on Robotics and Automation, 1985