David Abercrombie

According to our database, David Abercrombie authored at least 12 papers between 1997 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

An innovative method to automate the waiver of IP-level DRC violations.

John Ferguson, Sandeep Koranne, David Abercrombie

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

2009

Use of lithography simulation for the calibration of equation-based design rule checks.

David Abercrombie, Fedor Pikus, Cosmin Cazan

Proceedings of the 46th Design Automation Conference, 2009

2008

Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data.

Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann

Proceedings of the 2008 IEEE International Test Conference, 2008

2006

DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield.

David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman

Proceedings of the 19th International Conference on VLSI Design (VLSI Design 2006), 2006

Method for Managing Electromigration in SOC'S When Designing for Both Reliability and Manufacturing.

Karen Chow, David Abercrombie, Mark Basel

Proceedings of the 2006 IEEE International SOC Conference, Austin, Texas, USA, 2006

2005

Value-Added Defect Testing Techniques.

Jay Jahangiri, David Abercrombie

IEEE Des. Test Comput., 2005

Meeting Nanometer DPM Requirements Through DFT.

Jay Jahangiri, David Abercrombie

Proceedings of the 6th International Symposium on Quality of Electronic Design (ISQED 2005), 2005

2004

ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test.

Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Process monitoring via independent components.

Thaddeus T. Shannon, David Abercrombie, James McNames

Proceedings of the IEEE International Conference on Systems, 2003

Semiconductor manufacturing process visualization.

James McNames, David Abercrombie, David Turner, Thaddeus T. Shannon

Proceedings of the IEEE International Conference on Systems, 2003

2002

Isolating and Removing Sources of Variation in Test Data.

David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

1997

Industry-Government Collaboration: Queensland 's IT&T Strategy and the Information Industries Board.

David Abercrombie, Guy G. Gable

Proceedings of the Third Pacific Asia Conference on Information Systems, 1997