Dave Y.-W. Lin
Orcid: 0000-0001-7203-4304
According to our database1,
Dave Y.-W. Lin
authored at least 5 papers
between 2020 and 2022.
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Bibliography
2022
Rad-Hard Designs by Automated Latching-Delay Assignment and Time-Borrowable D-Flip-Flop.
IEEE Trans. Computers, 2022
2021
A Delay-Adjustable, Self-Testable Flip-Flop for Soft-Error Tolerability and Delay-Fault Testability.
ACM Trans. Design Autom. Electr. Syst., 2021
Proceedings of the IEEE International Test Conference in Asia, 2021
2020
DAD-FF: Hardening Designs by Delay-Adjustable D-Flip-Flop for Soft-Error-Rate Reduction.
IEEE Trans. Very Large Scale Integr. Syst., 2020
Proceedings of the 29th IEEE Asian Test Symposium, 2020