Dave Reid

According to our database, Dave Reid authored at least 12 papers between 1994 and 2015.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2015

Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits.

A. Asenov, Jie Ding, Dave Reid, Plamen Asenov, Salvatore M. Amoroso, Fikru Adamu-Lema, Louis Gerrer

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow.

Razaidi Hussin, Louis Gerrer, Jie Ding, Liping Wang, Salvatore M. Amoroso, Binjie Cheng, Dave Reid, Pieter Weckx, Marko Simicic, Jacopo Franco, Annelies Vanderheyden, Danielle Vanhaeren, Naoto Horiguchi, Ben Kaczer, Asen Asenov

Proceedings of the 45th European Solid State Device Research Conference, 2015

2014

Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review.

Louis Gerrer, Jie Ding, Salvatore M. Amoroso, Fikru Adamu-Lema, Razaidi Hussin, Dave Reid, Campbell Millar, A. Asenov

Microelectron. Reliab., 2014

2013

SRAM device and cell co-design considerations in a 14nm SOI FinFET technology.

Binjie Cheng, Xingsheng Wang, Andrew R. Brown, Jente B. Kuang, Dave Reid, Campbell Millar, Sani R. Nassif, Asen Asenov

Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models.

Plamen Asenov, David New, Dave Reid, Campbell Millar, Scott Roy, Asen Asenov

Proceedings of 2013 International Conference on IC Design & Technology, 2013

Investigation of SRAM using BTI-aware statistical compact models.

Jie Ding, Dave Reid, Campbell Millar, Asen Asenov

Proceedings of the European Solid-State Device Research Conference, 2013

2012

An advanced statistical compact model strategy for SRAM simulation at reduced VDD.

Plamen Asenov, Dave Reid, Scott Roy, Campbell Millar, Asen Asenov

Proceedings of the 2012 European Solid-State Device Research Conference, 2012

2011

The evolution of standard cell libraries for future technology nodes.

James Alfred Walker, James A. Hilder, Dave Reid, Asen Asenov, Scott Roy, Campbell Millar, Andy M. Tyrrell

Genet. Program. Evolvable Mach., 2011

Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis.

Michael Merrett, Plamen Asenov, Yangang Wang, Mark Zwolinski, Dave Reid, Campbell Millar, Scott Roy, Zhenyu Liu, Stephen B. Furber, Asen Asenov

Proceedings of the Design, Automation and Test in Europe, 2011

2009

Enabling Cutting-Edge Semiconductor Simulation through Grid Technology.

Asen Asenov, Dave Reid, Campbell Millar, Scott Roy, Gareth Roy, Richard O. Sinnott, Gordon Stewart, Graeme Robert Stewart

Proceedings of the Large-Scale Scientific Computing, 7th International Conference, 2009

2008

Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET.

Urban Kovac, Dave Reid, Campbell Millar, Gareth Roy, Scott Roy, Asen Asenov

Microelectron. Reliab., 2008

1994

Speed-Up of Scalable Iterative Linear Solvers Implemented on an Array of Transputers.

Asen Asenov, Dave Reid, John R. Barker

Parallel Comput., 1994