Darsen D. Lu

Orcid: 0000-0002-1956-6093

According to our database1, Darsen D. Lu authored at least 10 papers between 2010 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2024
Numerical Simulations of Gate-Granularity- Induced Subthreshold Characteristics Deterioration of MOSFETs Magnified at Cryogenic Temperatures.
IEEE Access, 2024

2023
CIMulator: A Comprehensive Simulation Platform for Computing-In-Memory Circuit Macros with Low Bit-Width and Real Memory Materials.
CoRR, 2023

MOSFET Characterization with Reduced Supply Voltage at Low Temperatures for Power Efficiency Maximization.
Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

2022
First Demonstration of Vertical Stacked Hetero-Oriented n-Ge (111)/p-Ge (100) CFET toward Mobility Balance Engineering.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

2021
Neuromorphic Computing with Deeply Scaled Ferroelectric FinFET in Presence of Process Variation, Device Aging and Flicker Noise.
CoRR, 2021

Alleviation of Temperature Variation Induced Accuracy Degradation in Ferroelectric FinFET Based Neural Network.
CoRR, 2021

2020
Ferroelectric FET Compact Model for Neuromorphic.
Dataset, March, 2020

Compact Device Models for FinFET and Beyond.
CoRR, 2020

Tri-Gate Ferroelectric FET Characterization and Modelling for Online Training of Neural Networks at Room Temperature and 233K.
Proceedings of the 2020 Device Research Conference, 2020

2010
Compact Modeling of Variation in FinFET SRAM Cells.
IEEE Des. Test Comput., 2010


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