Dariusz Czysz

According to our database, Dariusz Czysz authored at least 14 papers between 2007 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Perspectives of Motor Functional Upper Extremity Recovery with the Use of Immersive Virtual Reality in Stroke Patients.

Pawel Sip, Marta Kozlowska, Dariusz Czysz, Przemyslaw Daroszewski, Przemyslaw Lisinski

Sensors, January, 2023

2013

On Deploying Scan Chains for Data Storage in Test Compression Environment.

Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer

IEEE Des. Test, 2013

2012

Low power test application with selective compaction in VLSI designs.

Dariusz Czysz, Janusz Rajski, Jerzy Tyszer

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression.

Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Przemyslaw Szczerbicki, Jerzy Tyszer

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

Reduced ATE Interface for High Test Data Compression.

Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer

Proceedings of the 16th European Test Symposium, 2011

2010

On Compaction Utilizing Inter and Intra-Correlation of Unknown States.

Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

Low power compression of incompatible test cubes.

Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Przemyslaw Szczerbicki, Jerzy Tyszer

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Low-Power Scan Operation in Test Compression Environment.

Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

Highly X-Tolerant Selective Compaction of Test Responses.

Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Compression based on deterministic vector clustering of incompatible test cubes.

Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

Low-Power Test Data Application in EDT Environment Through Decompressor Freeze.

Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008

Low Power Scan Shift and Capture in the EDT Environment.

Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

Low Power Embedded Deterministic Test.

Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

New Test Data Decompressor for Low Power Applications.

Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer

Proceedings of the 44th Design Automation Conference, 2007