Daozheng Wei

According to our database1, Daozheng Wei authored at least 7 papers between 1986 and 1996.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

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In proceedings 
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PhD thesis 
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Links

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Bibliography

1996
Accelerated techniques in stem fault simulation.
J. Comput. Sci. Technol., 1996

1994
GLOBAL: A design for random testability algorithm.
J. Comput. Sci. Technol., 1994

An Optimal Design for Parallel Test Generation Based on Circuit Partitioning.
Proceedings of the Seventh International Conference on VLSI Design, 1994

1993
Deductive fault simulation algorithm based on fault collapsing.
J. Comput. Sci. Technol., 1993

DLJ: A dynamic line-justification algorithm for test generation.
J. Comput. Sci. Technol., 1993

1992
A Global Test Point Placement Algorithm of Combinational Circuits.
Proceedings of the Fifth International Conference on VLSI Design, 1992

1986
A New Testability Measure for Digital Circuits.
Proceedings of the Proceedings International Test Conference 1986, 1986


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