Dany Minier

According to our database, Dany Minier authored at least 14 papers between 2003 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Multi-Stage Jitter-Reduction and Frequency Multiplication for 54 GHz ATE Clocks.

David C. Keezer, Dany Minier

Proceedings of the IEEE International Test Conference in Asia, 2024

Characterization of Ultra-low Random Jitter Reduction Methods up to 36 GHz.

David C. Keezer, Dany Minier, Hongjie Li

Proceedings of the IEEE European Test Symposium, 2024

2023

Experimental Evaluation of Jitter Reduction Methods for Multi-Gigahertz Test.

David C. Keezer, Dany Minier, Hongjie Li

Proceedings of the IEEE International Test Conference in Asia, 2023

2010

Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic.

David C. Keezer, Carl Gray, Dany Minier, Patrice Ducharme

J. Electron. Test., 2010

2009

A development platform and electronic modules for automated test up to 20 Gbps.

David C. Keezer, Carl Gray, A. M. Majid, Dany Minier, Patrice Ducharme

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing.

David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop

VLSI Design, 2008

An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test.

David C. Keezer, Dany Minier, Patrice Ducharme, A. M. Majid

Proceedings of the 2008 IEEE International Test Conference, 2008

Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications.

David C. Keezer, Dany Minier, Patrice Ducharme

Proceedings of the Design, Automation and Test in Europe, 2008

2007

Multi-GHz loopback testing using MEMs switches and SiGe logic.

David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop

Proceedings of the 2007 IEEE International Test Conference, 2007

Method for reducing jitter in multi-gigahertz ATE.

David C. Keezer, Dany Minier, Patrice Ducharme

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses.

David C. Keezer, Dany Minier, Patrice Ducharme

IEEE Des. Test Comput., 2006

2004

Multiplexing ATE Channels for Production Testing at 2.5 Gbps.

David C. Keezer, Dany Minier, Marie-Christine Caron

IEEE Des. Test Comput., 2004

Modular Extension of ATE to 5 Gbps.

David C. Keezer, Dany Minier, F. Binette

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

A Production-Oriented Multiplexing System for Testing above 2.5 Gbps.

David C. Keezer, Dany Minier, Marie-Christine Caron

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003