Danijel Dankovic

According to our database, Danijel Dankovic authored at least 17 papers between 2002 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering.

Danijel Dankovic, Milos Marjanovic, Nikola Mitrovic, Emilija Zivanovic, Milan Dankovic, Aneta Prijic, Zoran Prijic

IEEE Trans. Educ., April, 2023

Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System.

Marko S. Andjelkovic, Junchao Chen, Rizwan Tariq Syed, Fabian Vargas, Markus Ulbricht, Milos Krstic, Stefan D. Ilic, Milos Marjanovic, Sandra Veljkovic, Nikola Mitrovic, Danijel Dankovic, Goran S. Ristic, Russell Duane, Nikola Vasovic, Aleksandar Jaksic, Alberto J. Palma, Antonio M. Lallena, Miguel Ángel Carvajal

Proceedings of the 26th Euromicro Conference on Digital System Design, 2023

2022

Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress.

Sandra Veljkovic, Nikola Mitrovic, Vojkan Davidovic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Srboljub Stankovic, Marko S. Andjelkovic, Zoran Prijic, Ivica Manic, Aneta Prijic, Goran S. Ristic, Danijel Dankovic

J. Circuits Syst. Comput., December, 2022

2020

A smart data logger system based on sensor and Internet of Things technology as part of the smart faculty.

Milos Djordjevic, Branislav Jovicic, Stefan Markovic, Vesna Paunovic, Danijel Dankovic

J. Ambient Intell. Smart Environ., 2020

2018

NBTI and irradiation related degradation mechanisms in power VDMOS transistors.

Ninoslav Stojadinovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Srboljub Stankovic, Aneta Prijic, Zoran Prijic, Ivica Manic, Danijel Dankovic

Microelectron. Reliab., 2018

A review of pulsed NBTI in P-channel power VDMOSFETs.

Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Zoran Prijic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Ninoslav Stojadinovic

Microelectron. Reliab., 2018

2013

An Electromechanical Approach to a Printed Circuit Board Design Course.

Danijel Dankovic, Ljubomir Vracar, Aneta Prijic, Zoran Prijic

IEEE Trans. Educ., 2013

2011

NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions.

Ivica Manic, Danijel Dankovic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic, Ninoslav Stojadinovic

Microelectron. Reliab., 2011

2010

Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress.

Ninoslav Stojadinovic, Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic

Microelectron. Reliab., 2010

2009

Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs.

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic

Microelectron. Reliab., 2009

2008

Negative bias temperature instability in n-channel power VDMOSFETs.

Danijel Dankovic, Ivica Manic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Ninoslav Stojadinovic

Microelectron. Reliab., 2008

Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs.

Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Danijel Dankovic, Snezana Golubovic, Ninoslav Stojadinovic

IET Circuits Devices Syst., 2008

2007

Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs.

Danijel Dankovic, Ivica Manic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Ninoslav Stojadinovic

Microelectron. Reliab., 2007

2006

NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs.

Danijel Dankovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic

Microelectron. Reliab., 2006

2005

Effects of electrical stressing in power VDMOSFETs.

Ninoslav Stojadinovic, Ivica Manic, Vojkan Davidovic, Danijel Dankovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Sima Dimitrijev

Microelectron. Reliab., 2005

Negative bias temperature instability mechanisms in p-channel power VDMOSFETs.

Ninoslav Stojadinovic, Danijel Dankovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Ivica Manic, Snezana Golubovic

Microelectron. Reliab., 2005

2002

Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs.

Ninoslav Stojadinovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Danijel Dankovic, Snezana Golubovic, Sima Dimitrijev

Microelectron. Reliab., 2002