Daniel Yingling

According to our database, Daniel Yingling authored at least 6 papers between 2015 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

14.3 A 3nm Adaptive Clock Duty-Cycle Controller for Mitigating Aging-Induced Clock Duty-Cycle Distortion.

Daniel Yingling, Yimai Peng, Robert Vachon, Dipti Pal, Sagar Jariwala, Felipe G. Cabral, Jason Hu, Rajan Verma, Vamshidhar Chiranji, Anil Kumar, Santanu Sarma, Keith A. Bowman

Proceedings of the IEEE International Solid-State Circuits Conference, 2024

2019

A 7nm Leakage-Current-Supply Circuit for LDO Dropout Voltage Reduction.

Keith A. Bowman, Samantak Gangopadhyay, Francois Atallah, Hoan Nguyen, Jihoon Jeong, Daniel Yingling, Anthony Polomik, Mahesh Harinath, Nathaniel Reeves, Amer Cassier, Brad Appel, Arijit Raychowdhury

Proceedings of the 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, 2019

A 7nm All-Digital Unified Voltage and Frequency Regulator Based on a High-Bandwidth 2-Phase Buck Converter with Package Inductors.

Francois Atallah, Keith A. Bowman, Hoan Nguyen, Jihoon Jeong, Daniel Yingling, Yu Sun, Brad Appel, Anthony Polomik, Mahesh Harinath, Joshua Morelli, Thomas Moore, Nathaniel Reeves, Amer Cassier, Arijit Raychowdhury

Proceedings of the IEEE International Solid- State Circuits Conference, 2019

2018

A 7NM Double-Pumped 6R6W Register File for Machine Learning Memory.

Hoan Nguyen, Jihoon Jeong, Francois Atallah, Marc Jansen, Anthony Polomik, Daniel Yingling, Harsha Akkaraju, Brad Appel, Rahul Nadkarni, Keith A. Bowman

Proceedings of the 2018 IEEE Symposium on VLSI Circuits, 2018

2016

A 16 nm All-Digital Auto-Calibrating Adaptive Clock Distribution for Supply Voltage Droop Tolerance Across a Wide Operating Range.

Keith A. Bowman, Sarthak Raina, Todd Bridges, Daniel Yingling, Hoan Nguyen, Brad Appel, Yesh Kolla, Jihoon Jeong, Francois Atallah, David Hansquine

IEEE J. Solid State Circuits, 2016

2015

8.5 A 16nm auto-calibrating dynamically adaptive clock distribution for maximizing supply-voltage-droop tolerance across a wide operating range.

Keith A. Bowman, Sarthak Raina, Todd Bridges, Daniel Yingling, Hoan Nguyen, Brad Appel, Yesh Kolla, Jihoon Jeong, Francois Atallah, David Hansquine

Proceedings of the 2015 IEEE International Solid-State Circuits Conference, 2015