Daniel Söderström

According to our database, Daniel Söderström authored at least 6 papers between 2020 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks.

Lucas Matana Luza, Annachiara Ruospo, Daniel Söderström, Carlo Cazzaniga, Maria Kastriotou, Ernesto Sánchez, Alberto Bosio, Luigi Dilillo

IEEE Trans. Emerg. Top. Comput., 2022

Properties of Gd-Doped Sol-Gel Silica Glass Radioluminescence under Electron Beams.

Daniel Söderström, Oskari Timonen, Heikki Kettunen, Risto Kronholm, Hicham El Hamzaoui, Bruno Capoen, Youcef Ouerdane, Adriana Morana, Arto Javanainen, Géraud Bouwmans, Mohamed Bouazaoui, Sylvain Girard

Sensors, 2022

2021

Radioluminescence Response of Ce-, Cu-, and Gd-Doped Silica Glasses for Dosimetry of Pulsed Electron Beams.

Daniel Söderström, Heikki Kettunen, Adriana Morana, Arto Javanainen, Youcef Ouerdane, Hicham El Hamzaoui, Bruno Capoen, Géraud Bouwmans, Mohamed Bouazaoui, Sylvain Girard

Sensors, 2021

Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study.

Lucas Matana Luza, Daniel Söderström, André Martins Pio de Mattos, Eduardo Augusto Bezerra, Carlo Cazzaniga, Maria Kastriotou, Christian Poivey, Luigi Dilillo

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

2020

Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM.

Lucas Matana Luza, Daniel Söderström, Helmut Puchner, Rubén García Alía, Manon Letiche, Alberto Bosio, Luigi Dilillo

Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems.

Lucas Matana Luza, Daniel Söderström, Georgios Tsiligiannis, Helmut Puchner, Carlo Cazzaniga, Ernesto Sánchez, Alberto Bosio, Luigi Dilillo

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020