Daniel Kraak

According to our database, Daniel Kraak authored at least 13 papers between 2017 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2022

On BTI Aging Rejuvenation in Memory Address Decoders.

Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

2020

eSRAM Reliability: Why is it still not optimally solved?

Daniël Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

Mitigation of Sense Amplifier Degradation Using Skewed Design.

Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019

Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM.

Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2019

Software-Based Mitigation for Memory Address Decoder Aging.

Daniel H. P. Kraak, Cemil Cem Gürsoy, Innocent O. Agbo, Mottaqiallah Taouil, Maksim Jenihhin, Jaan Raik, Said Hamdioui

Proceedings of the IEEE Latin American Test Symposium, 2019

Hardware-Based Aging Mitigation Scheme for Memory Address Decoder.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 24th IEEE European Test Symposium, 2019

Methodology for Application-Dependent Degradation Analysis of Memory Timing.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

2018

Impact and mitigation of SRAM read path aging.

Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene

Microelectron. Reliab., 2018

Device aging: A reliability and security concern.

Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi

Proceedings of the 23rd IEEE European Test Symposium, 2018

Degradation analysis of high performance 14nm FinFET SRAM.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

2017

Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads.

Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2017

Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier.

Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2017

Mitigation of sense amplifier degradation using input switching.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017