Daniel Arbet

Orcid: 0000-0001-9412-4503

According to our database1, Daniel Arbet authored at least 49 papers between 2011 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2023
0.5 V Versatile Voltage- and Transconductance-Mode Analog Filter Using Differential Difference Transconductance Amplifier.
Sensors, January, 2023

Design of the Slope Detection Circuit for On-Chip Current Sensing.
Proceedings of the 30th International Conference on Mixed Design of Integrated Circuits and System, 2023

Low-Power CMOS Frequency Comparator.
Proceedings of the 46th MIPRO ICT and Electronics Convention, 2023

2022
A 0.3-V High Linear Rail-to-Rail Bulk-Driven OTA in 0.13 μm CMOS.
IEEE Trans. Circuits Syst. II Express Briefs, 2022

Low-Power Rail-to-Rail Comparator in 130 nm CMOS Technology.
Proceedings of the 32nd International Conference Radioelektronika, 2022

High Power Supply Rejection LDO Regulator for Switching Applications.
Proceedings of the 45th Jubilee International Convention on Information, 2022

On-Chip Current Sensing Approaches for DC-DC Converters.
Proceedings of the 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2022

Autocalibration Approach for Improving Robustness of Analog ICs.
Proceedings of the 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2022

2021
Low-Voltage DC-DC Converter for IoT and On-Chip Energy Harvester Applications.
Sensors, 2021

Investigation of Inductor-based Fully On-chip Boost Converter.
Proceedings of the 2021 28th International Conference on Mixed Design of Integrated Circuits and System, 2021

Fully On-Chip Low-Drop Regulator for Low-Power Applications.
Proceedings of the 44th International Convention on Information, 2021

EKV MOS Transistor Model For Ultra Low-Voltage Bulk-Driven IC Design.
Proceedings of the 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2021

Enhanced Reliability of Fully Differential Difference Amplifier Through On-chip Digital Calibration.
Proceedings of the 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2021

EKV Model for Bulk-Driven Circuit Design Using gmb/ID Method.
Proceedings of the 2021 IEEE AFRICON, 2021

2020
Autonomous On-Chip Digital Calibration for Analog ICs in Nanotechnologies.
Proceedings of the 30th International Conference Radioelektronika, 2020

Multi-Topology DC-DC Converter for Low-Voltage Energy Harvesting Systems.
Proceedings of the 43rd International Convention on Information, 2020

Dynamic Properties Of Ultra Low-Voltage Rail-to-Rail Comparator Designed In 130 nm CMOS Technology.
Proceedings of the 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2020

2019
Towards Energy-autonomous Integrated Systems Through Ultra-low Voltage Analog IC Design.
Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019

Voltage-to-Frequency Converter for Ultra-Low-Voltage Applications.
Proceedings of the 42nd International Convention on Information and Communication Technology, 2019

Ultra Low-Voltage Rail-to-Rail Comparator Design in 130 nm CMOS Technology.
Proceedings of the 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2019

Investigation of Low-Voltage, Sub-threshold Charge Pump with Parasitics Aware Design Methodology.
Proceedings of the 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2019

Performance Analysis Of Ultra Low-Voltage Rail-to-Rail Comparator In 130 nm CMOS Technology.
Proceedings of the 2019 IEEE AFRICON, Accra, Ghana, September 25-27, 2019, 2019

2018
Ultra-low-voltage boosted driver for self-powered systems.
Microelectron. Reliab., 2018

Bulk-driven fully differential difference amplifier for ultra-low voltage applications.
Proceedings of the 41st International Convention on Information and Communication Technology, 2018

Design and Performance Analysis of Ultra-Low Voltage Rail-to-Rail Comparator in 130 nm CMOS Technology.
Proceedings of the 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2018

Two-Stage Bulk-Driven Variable Gain Amplifier for Low-Voltage Applications.
Proceedings of the 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2018

2017
A Novel Method Towards Time-Efficient Fault Analysis of Analog and Mixed-Signal Circuits.
J. Circuits Syst. Comput., 2017

130 nm CMOS Bulk-Driven Variable Gain Amplifier for Low-Voltage Applications.
J. Circuits Syst. Comput., 2017

Ultra-low-voltage driver for large load capacitance in 130nm CMOS technology.
Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017

Low-power bulk-driven rail-to-rail comparator in 130 nm CMOS technology.
Proceedings of the IEEE AFRICON 2017, Cape Town, South Africa, September 18-20, 2017, 2017

2016
Fully Differential Difference Amplifier for Low-Noise and Low-Distortion Applications.
J. Circuits Syst. Comput., 2016

Variable-gain amplifier for ultra-low voltage applications in 130nm CMOS technology.
Proceedings of the 39th International Convention on Information and Communication Technology, 2016

CMOS variable-gain amplifier for low-frequency applications.
Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

Comparison of gate-driven and bulk-driven current mirror topologies.
Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

Impedance calculation based method for AC fault analysis of mixed-signal circuits.
Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

Low-voltage bulk-driven variable gain amplifier in 130 nm CMOS technology.
Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

2015
Investigation of the optimum oscillation frequency value towards increasing the efficiency of OBIST approach.
Microelectron. Reliab., 2015

Readout interface for capacitive MEMS microphone in CMOS technology.
Proceedings of the 22nd International Conference Mixed Design of Integrated Circuits & Systems, 2015

Fully Differential Difference Amplifier for Low-Noise Applications.
Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

2014
BIST architecture for oscillation test of analog ICs and investigation of test hardware influence.
Microelectron. Reliab., 2014

A new I<sub>DDT</sub> test approach and its efficiency in covering resistive opens in SRAM arrays.
Microprocess. Microsystems, 2014

An approach towards selection of the oscillation frequency for oscillation test of analog ICs.
Proceedings of the 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2014

A novel impedance calculation method and its time efficiency evaluation.
Proceedings of the 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2014

2013
Digital methods of offset compensation in 90nm CMOS operational amplifiers.
Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

Efficiency of oscillation-based BIST in 90nm CMOS active analog filters.
Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

2012
Application of IDDT test towards increasing SRAM reliability in nanometer technologies.
Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters.
Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

2011
Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies.
Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

Increasing the efficiency of analog OBIST using on-chip compensation of technology variations.
Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011


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