Daniel Arbet

Orcid: 0000-0001-9412-4503

According to our database¹, Daniel Arbet authored at least 49 papers between 2011 and 2023.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

Timeline

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In proceedings

Article

PhD thesis

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Other

Bibliography

2023

0.5 V Versatile Voltage- and Transconductance-Mode Analog Filter Using Differential Difference Transconductance Amplifier.

[BibT_eX]

[DOI]

Sensors, January, 2023

Design of the Slope Detection Circuit for On-Chip Current Sensing.

[BibT_eX]

[DOI]

Proceedings of the 30th International Conference on Mixed Design of Integrated Circuits and System, 2023

Low-Power CMOS Frequency Comparator.

[BibT_eX]

[DOI]

Proceedings of the 46th MIPRO ICT and Electronics Convention, 2023

2022

A 0.3-V High Linear Rail-to-Rail Bulk-Driven OTA in 0.13 μm CMOS.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. II Express Briefs, 2022

Low-Power Rail-to-Rail Comparator in 130 nm CMOS Technology.

[BibT_eX]

[DOI]

Proceedings of the 32nd International Conference Radioelektronika, 2022

High Power Supply Rejection LDO Regulator for Switching Applications.

[BibT_eX]

[DOI]

Proceedings of the 45th Jubilee International Convention on Information, 2022

On-Chip Current Sensing Approaches for DC-DC Converters.

[BibT_eX]

[DOI]

Proceedings of the 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2022

Autocalibration Approach for Improving Robustness of Analog ICs.

[BibT_eX]

[DOI]

Proceedings of the 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2022

2021

Low-Voltage DC-DC Converter for IoT and On-Chip Energy Harvester Applications.

[BibT_eX]

[DOI]

Sensors, 2021

Investigation of Inductor-based Fully On-chip Boost Converter.

[BibT_eX]

[DOI]

Proceedings of the 2021 28th International Conference on Mixed Design of Integrated Circuits and System, 2021

Fully On-Chip Low-Drop Regulator for Low-Power Applications.

[BibT_eX]

[DOI]

Proceedings of the 44th International Convention on Information, 2021

EKV MOS Transistor Model For Ultra Low-Voltage Bulk-Driven IC Design.

[BibT_eX]

[DOI]

Proceedings of the 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2021

Enhanced Reliability of Fully Differential Difference Amplifier Through On-chip Digital Calibration.

[BibT_eX]

[DOI]

Proceedings of the 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2021

EKV Model for Bulk-Driven Circuit Design Using gmb/ID Method.

[BibT_eX]

[DOI]

Proceedings of the 2021 IEEE AFRICON, 2021

2020

Autonomous On-Chip Digital Calibration for Analog ICs in Nanotechnologies.

[BibT_eX]

[DOI]

Proceedings of the 30th International Conference Radioelektronika, 2020

Multi-Topology DC-DC Converter for Low-Voltage Energy Harvesting Systems.

[BibT_eX]

[DOI]

Proceedings of the 43rd International Convention on Information, 2020

Dynamic Properties Of Ultra Low-Voltage Rail-to-Rail Comparator Designed In 130 nm CMOS Technology.

[BibT_eX]

[DOI]

Proceedings of the 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2020

2019

Towards Energy-autonomous Integrated Systems Through Ultra-low Voltage Analog IC Design.

[BibT_eX]

[DOI]

Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019

Voltage-to-Frequency Converter for Ultra-Low-Voltage Applications.

[BibT_eX]

[DOI]

Proceedings of the 42nd International Convention on Information and Communication Technology, 2019

Ultra Low-Voltage Rail-to-Rail Comparator Design in 130 nm CMOS Technology.

[BibT_eX]

[DOI]

Proceedings of the 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2019

Investigation of Low-Voltage, Sub-threshold Charge Pump with Parasitics Aware Design Methodology.

[BibT_eX]

[DOI]

Proceedings of the 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2019

Performance Analysis Of Ultra Low-Voltage Rail-to-Rail Comparator In 130 nm CMOS Technology.

[BibT_eX]

[DOI]

Proceedings of the 2019 IEEE AFRICON, Accra, Ghana, September 25-27, 2019, 2019

2018

Ultra-low-voltage boosted driver for self-powered systems.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2018

Bulk-driven fully differential difference amplifier for ultra-low voltage applications.

[BibT_eX]

[DOI]

Proceedings of the 41st International Convention on Information and Communication Technology, 2018

Design and Performance Analysis of Ultra-Low Voltage Rail-to-Rail Comparator in 130 nm CMOS Technology.

[BibT_eX]

[DOI]

Proceedings of the 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2018

Two-Stage Bulk-Driven Variable Gain Amplifier for Low-Voltage Applications.

[BibT_eX]

[DOI]

Proceedings of the 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2018

2017

A Novel Method Towards Time-Efficient Fault Analysis of Analog and Mixed-Signal Circuits.

[BibT_eX]

[DOI]

J. Circuits Syst. Comput., 2017

130 nm CMOS Bulk-Driven Variable Gain Amplifier for Low-Voltage Applications.

[BibT_eX]

[DOI]

J. Circuits Syst. Comput., 2017

Ultra-low-voltage driver for large load capacitance in 130nm CMOS technology.

[BibT_eX]

[DOI]

Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017

Low-power bulk-driven rail-to-rail comparator in 130 nm CMOS technology.

[BibT_eX]

[DOI]

Proceedings of the IEEE AFRICON 2017, Cape Town, South Africa, September 18-20, 2017, 2017

2016

Fully Differential Difference Amplifier for Low-Noise and Low-Distortion Applications.

[BibT_eX]

[DOI]

J. Circuits Syst. Comput., 2016

Variable-gain amplifier for ultra-low voltage applications in 130nm CMOS technology.

[BibT_eX]

[DOI]

Proceedings of the 39th International Convention on Information and Communication Technology, 2016

CMOS variable-gain amplifier for low-frequency applications.

[BibT_eX]

[DOI]

Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

Comparison of gate-driven and bulk-driven current mirror topologies.

[BibT_eX]

[DOI]

Matej Rakus

Viera Stopjaková

Daniel Arbet

Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

Impedance calculation based method for AC fault analysis of mixed-signal circuits.

[BibT_eX]

[DOI]

Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

Low-voltage bulk-driven variable gain amplifier in 130 nm CMOS technology.

[BibT_eX]

[DOI]

Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

2015

Investigation of the optimum oscillation frequency value towards increasing the efficiency of OBIST approach.

[BibT_eX]

[DOI]

Daniel Arbet

Viera Stopjaková

Martin Kovác

Microelectron. Reliab., 2015

Readout interface for capacitive MEMS microphone in CMOS technology.

[BibT_eX]

[DOI]

Proceedings of the 22nd International Conference Mixed Design of Integrated Circuits & Systems, 2015

Fully Differential Difference Amplifier for Low-Noise Applications.

[BibT_eX]

[DOI]

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

2014

BIST architecture for oscillation test of analog ICs and investigation of test hardware influence.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2014

A new I<sub>DDT</sub> test approach and its efficiency in covering resistive opens in SRAM arrays.

[BibT_eX]

[DOI]

Microprocess. Microsystems, 2014

An approach towards selection of the oscillation frequency for oscillation test of analog ICs.

[BibT_eX]

[DOI]

Proceedings of the 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2014

A novel impedance calculation method and its time efficiency evaluation.

[BibT_eX]

[DOI]

Proceedings of the 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2014

2013

Digital methods of offset compensation in 90nm CMOS operational amplifiers.

[BibT_eX]

[DOI]

Gabriel Nagy

Daniel Arbet

Viera Stopjaková

Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

Efficiency of oscillation-based BIST in 90nm CMOS active analog filters.

[BibT_eX]

[DOI]

Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

2012

Application of IDDT test towards increasing SRAM reliability in nanometer technologies.

[BibT_eX]

[DOI]

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters.

[BibT_eX]

[DOI]

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

2011

Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies.

[BibT_eX]

[DOI]

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

Increasing the efficiency of analog OBIST using on-chip compensation of technology variations.

[BibT_eX]

[DOI]

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

Daniel Arbet

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