Damien Zander

Orcid: 0000-0002-8872-8404

According to our database1, Damien Zander authored at least 7 papers between 2001 and 2023.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

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PhD thesis 
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Links

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Bibliography

2023
Model-based engineering for designing cyber-physical systems from product specifications.
Comput. Ind., 2023

2007
Stress induced gate-drain leakage current in ultra-thin gate oxide.
Microelectron. Reliab., 2007

Low voltage stress induced leakage current and time to breakdown in ultra-thin (1.2-2.3nm) oxides.
Microelectron. Reliab., 2007

2005
Comparison of interfaces states density through their energy distribution and LVSILC induced by uniform and localized injections in 2.3nm thick oxides.
Microelectron. Reliab., 2005

Low voltage SILC and P- and N-MOSFET gate oxide reliability.
Microelectron. Reliab., 2005

2003
Contribution of oxide traps on defect creation and LVSILC conduction in ultra thin gate oxide devices.
Microelectron. Reliab., 2003

2001
High field stress at and above room temperature in 2.3 nm thick oxides.
Microelectron. Reliab., 2001


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