Dale Meehl

According to our database, Dale Meehl authored at least 5 papers between 2006 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Advancing test compression to the physical dimension.

Krishna Chakravadhanula, Vivek Chickermane, Paul Cunningham, Brian Foutz, Dale Meehl, Louis Milano, Christos Papameletis, David Scott, Steev Wilcox

Proceedings of the IEEE International Test Conference, 2017

2012

LBIST/ATPG Technologies for On-Demand Digital Logic Testing in Automotive Circuits.

Dale Meehl, Bassilios Petrakis, Ping Zhang

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2009

A Partially-Exhaustive Gate Transition Fault Model.

Brion L. Keller, Dale Meehl, Anis Uzzaman, Richard Billings

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2007

Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns.

Gaurav Bhargava, Dale Meehl, James Sage

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis.

Sanae Seike, Ken Namura, Yukio Ohya, Anis Uzzaman, Shinichi Arima, Dale Meehl, Vivek Chickermane, Azumi Kobayashi, Satoshi Tanaka, Hiroyuki Adachi

Proceedings of the 15th Asian Test Symposium, 2006