Daisuke Iimori

According to our database, Daisuke Iimori authored at least 7 papers between 2021 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing.

Shogo Katayama, Takayuki Nakatani, Daisuke Iimori, Misaki Takagi, Yujie Zhao, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi

IEICE Electron. Express, 2023

Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion.

Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Daisuke Iimori, Misaki Takagi, Yujie Zhao, Shuhei Yamamoto, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the IEEE International Test Conference, 2023

2022

Innovative Practices Track: Innovative Analog Circuit Testing Technologies.

Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel J. Barragán, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST.

Keno Sato, Takayuki Nakatani, Shogo Katayama, Daisuke Iimori, Gaku Ogihara, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the IEEE 31st Asian Test Symposium, 2022

2021

Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer.

Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Akemi Hatta, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Yujie Zhao, Minh Tri Tran, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the IEEE International Test Conference, 2021

Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production.

Gaku Ogihara, Takayuki Nakatani, Daisuke Iimori, Shogo Katayama, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Jianglin Wei, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the 28th IEEE International Conference on Electronics, 2021

High Precision Measurement of Sub-Nano Ampere Current in ATE Environment.

Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Gaku Ogihara, Daisuke Iimori, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the 30th IEEE Asian Test Symposium, 2021