D. X. Q. Shi

According to our database, D. X. Q. Shi authored at least 1 paper in 2006.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2006

Reliability study of underfill/chip interface under accelerated temperature cycling (ATC) loading.

Y. L. Zhang, D. X. Q. Shi, Wei Zhou

Microelectron. Reliab., 2006