D. Sámal

According to our database, D. Sámal authored at least 2 papers between 2006 and 2008.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2008

Reliability of reverse properties of power semiconductor devices: : Influence of surface dielectric layer and its experimental verification.

Václav Papez, B. Kojecký, D. Sámal

Microelectron. J., 2008

2006

Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices.

B. Kojecký, Václav Papez, D. Sámal

Microelectron. J., 2006