D. Nouguier
According to our database1,
D. Nouguier
authored at least 4 papers
between 2017 and 2019.
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Bibliography
2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
New NBTI models for degradation and relaxation kinetics valid over extended temperature and stress/recovery ranges.
Microelectron. Reliab., 2018
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018
2017
Proceedings of the 47th European Solid-State Device Research Conference, 2017