D. Floriot

According to our database, D. Floriot authored at least 3 papers between 2001 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2013

Analysis of Schottky gate degradation evolution in AlGaN/GaN HEMTs during HTRB stress.

Laurent Brunel, Benoit Lambert, P. Mezenge, J. Bataille, D. Floriot, Jan Grünenpütt, Hervé Blanck, D. Carisetti, Y. Gourdel, Nathalie Malbert, Arnaud Curutchet, Nathalie Labat

Microelectron. Reliab., 2013

2010

Reliability of high voltage/high power L/S-band Hbt technology.

Benoit Lambert, G. Jonsson, J. Bataille, C. Ollivier, P. Mezenge, H. Derewonko, H. Thomas, D. Floriot, Hervé Blanck, C. Moreau

Microelectron. Reliab., 2010

2001

Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.

Cezary Sydlo, Bastian Mottet, Husin Ganis, Hans L. Hartnagel, Viktor Krozer, Sylvain L. Delage, Simone Cassette, Eric Chartier, D. Floriot, Steven Bland

Microelectron. Reliab., 2001