D. Brazzelli

According to our database, D. Brazzelli authored at least 3 papers between 2002 and 2005.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2005

Impact of interface and bulk trapped charges on transistor reliability.

G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, Andrea Ghetti, N. Galbiati, G. Giusto, A. Garavaglia

Microelectron. Reliab., 2005

2003

Anomalous gate oxide conduction on isolation edges: analysis and process optimization.

Andrea Ghetti, D. Brazzelli, A. Benvenuti, G. Ghidini, Alessia Pavan

Microelectron. Reliab., 2003

2002

Evaluation methodology of thin dielectrics for non-volatile memory application.

G. Ghidini, D. Brazzelli

Microelectron. Reliab., 2002