D. Angot

According to our database, D. Angot authored at least 3 papers in 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Impact of gate oxide breakdown in logic gates from 28nm FDSOI CMOS technology.

M. Saliva, Florian Cacho, Cheikh Ndiaye, Vincent Huard, D. Angot, Alain Bravaix, Lorena Anghel

Proceedings of the IEEE International Reliability Physics Symposium, 2015

From BTI variability to product failure rate: A technology scaling perspective.

Vincent Huard, D. Angot, Florian Cacho

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI.

M. Saliva, Florian Cacho, Vincent Huard, X. Federspiel, D. Angot, Ahmed Benhassain, Alain Bravaix, Lorena Anghel

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015