Curtis Durfee

According to our database, Curtis Durfee authored at least 2 papers between 2020 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2022

SiGe Gate-All-around Nanosheet Reliability.

Huimei Zhou, Miaomiao Wang, Ruqiang Bao, Curtis Durfee, Liqiao Qin, Jingyun Zhang

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2020

NBTI Impact of Surface Orientation in Stacked Gate-All-Around Nanosheet Transistor.

Huimei Zhou, Miaomiao Wang, Jingyun Zhang, Koji Watanabe, Curtis Durfee, Shogo Mochizuki, Ruqiang Bao, Richard G. Southwick, Maruf Bhuiyan, Basker Veeraraghavan

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020