Cristina De Luca
According to our database1,
Cristina De Luca
authored at least 13 papers
between 2011 and 2023.
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Bibliography
2023
Proceedings of the 4th International Conference on Industry 4.0 and Smart Manufacturing (ISM 2023), 2023
2021
A review of energy-based indicators for assessing sustainability and circular economy in the agri-food production.
Proceedings of the 3rd International Conference on Industry 4.0 and Smart Manufacturing (ISM 2022), Virtual Event / Upper Austria University of Applied Sciences - Hagenberg Campus, 2021
Artificial Intelligence or Augmented Intelligence? Impact on our lives, rights and ethics.
Proceedings of the 3rd International Conference on Industry 4.0 and Smart Manufacturing (ISM 2022), Virtual Event / Upper Austria University of Applied Sciences - Hagenberg Campus, 2021
2018
Proceedings of the 14th IEEE International Conference on Automation Science and Engineering, 2018
2015
IEEE Trans Autom. Sci. Eng., 2015
2014
A sampling decision system for semiconductor manufacturing: relying on virtual metrology and actual measurements.
Proceedings of the 2014 Winter Simulation Conference, 2014
2013
Proceedings of the 2013 IEEE International Conference on Automation Science and Engineering, 2013
2012
Proceedings of the 2012 IEEE International Conference on Automation Science and Engineering, 2012
Proceedings of the 2012 IEEE International Conference on Automation Science and Engineering, 2012
2011
Nonparametric Virtual Sensors for Semiconductor Manufacturing - Using Information Theoretic Learning and Kernel Machines.
Proceedings of the ICINCO 2011 - Proceedings of the 8th International Conference on Informatics in Control, Automation and Robotics, Volume 2, Noordwijkerhout, The Netherlands, 28, 2011
A Virtual Metrology system for predicting CVD thickness with equipment variables and qualitative clustering.
Proceedings of the IEEE 16th Conference on Emerging Technologies & Factory Automation, 2011
Proceedings of the IEEE Conference on Automation Science and Engineering, 2011
Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing.
Proceedings of the IEEE Conference on Automation Science and Engineering, 2011