Corrado De Sio

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., April, 2024

Exploring the Resiliency of Hardware CNN for Aerospace Application.

[BibT_eX]

[DOI]

Proceedings of the 20th International Conference on Synthesis, 2024

Toward Fault-Tolerant Applications on Reconfigurable Systems-on-Chip.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2024

On the Fault Tolerance of Self-Supervised Training in Convolutional Neural Networks.

[BibT_eX]

[DOI]

Proceedings of the 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems, 2024

A New Reliability Analysis of RISC-V Soft Processor for Safety-Critical Systems.

[BibT_eX]

[DOI]

Proceedings of the 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems, 2024

Scalable K-Nearest Neighbors Implementation using Distributed Embedded Systems.

[BibT_eX]

[DOI]

Proceedings of the 21st ACM International Conference on Computing Frontiers, 2024

Enhancing the Robustness of System on FPGA by Routing Isolation.

[BibT_eX]

[DOI]

Davide Nicolini

Eleonora Vacca

Proceedings of the 21st ACM International Conference on Computing Frontiers, 2024

A Novel Robust Core for Detecting Node Failures in FPGA Clusters.

[BibT_eX]

[DOI]

Proceedings of the 21st ACM International Conference on Computing Frontiers, 2024

2023

Fighting for a future free from violence: A framework for real-time detection of "Signal for Help".

[BibT_eX]

[DOI]

Intell. Syst. Appl., 2023

High-Performance SET Hardening Technique for Vision-Oriented Applications.

[BibT_eX]

[DOI]

Proceedings of the 19th International Conference on Synthesis, 2023

PyXEL: Exploring Bitstream Analysis to Assess and Enhance the Robustness of Designs on FPGAs.

[BibT_eX]

[DOI]

David Merodio Codinachs

Filomena Decuzzi

Proceedings of the 19th International Conference on Synthesis, 2023

Enhanced Video Surveillance Systems for "Signal for Help" Detection on Edge Devices.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Technology and Society, 2023

Radiation-Induced Errors in the Software Level of Real-Time Soft Processing System.

[BibT_eX]

[DOI]

Salvatore Gabriele La Greca

Daniele Rizzieri

Andrea Portaluri

Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

Programmable SEL Test Monitoring System for Radiation Hardness Assurance.

[BibT_eX]

[DOI]

Proceedings of the 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, 2023

Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

A Framework for Uniformly Analyze and Mitigate Radiation-effects on FPGAs for Aerospace.

[BibT_eX]

[DOI]

Proceedings of the 20th ACM International Conference on Computing Frontiers, 2023

Reliability Analysis of Microarchitectural Faults in GPGPU-based HPC Systems.

[BibT_eX]

[DOI]

Proceedings of the 20th ACM International Conference on Computing Frontiers, 2023

Assessing the Robustness of Real-Time Operating System on Soft Processor against Multiple Bit Upset.

[BibT_eX]

[DOI]

Andrea Portaluri

Proceedings of the 20th ACM International Conference on Computing Frontiers, 2023

2022

FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms.

[BibT_eX]

[DOI]

IEEE Trans. Emerg. Top. Comput., 2022

A Placement-Oriented Mitigation Technique for Single Event Effect in Monolithic 3D IC.

[BibT_eX]

[DOI]

Proceedings of the 18th International Conference on Synthesis, 2022

Analysis and Mitigation of Soft-Errors on High Performance Embedded GPUs.

[BibT_eX]

[DOI]

Proceedings of the 21st International Symposium on Parallel and Distributed Computing, 2022

Radiation-induced Effects on DMA Data Transfer in Reconfigurable Devices.

[BibT_eX]

[DOI]

David Merodio Codinachs

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip.

[BibT_eX]

[DOI]

Proceedings of the IEEE European Test Symposium, 2022

Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Process.

[BibT_eX]

[DOI]

David Merodio Codinachs

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

Layout-oriented radiation effects mitigation in RISC-V soft processor.

[BibT_eX]

[DOI]

Eleonora Vacca

Proceedings of the CF '22: 19th ACM International Conference on Computing Frontiers, Turin, Italy, May 17, 2022

On the Reliability of Real-Time Operating System on Embedded Soft Processor for Space Applications.

[BibT_eX]

[DOI]

Proceedings of the Architecture of Computing Systems - 35th International Conference, 2022

2021

A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2021

On the Evaluation of SEEs on Open-Source Embedded Static RAMs.

[BibT_eX]

[DOI]

Proceedings of the 29th IFIP/IEEE International Conference on Very Large Scale Integration, 2021

Design and Mitigation Techniques of Radiation Induced SEEs on Open-Source Embedded Static RAMs.

[BibT_eX]

[DOI]

Proceedings of the VLSI-SoC: Technology Advancement on SoC Design, 2021

A New Domains-based Isolation Design Flow for Reconfigurable SoCs.

[BibT_eX]

[DOI]

Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021

A Neutron Generator Testing Platform for the Radiation Analysis of SRAM-based FPGAs.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2021

SEU Evaluation of Hardened-by-Replication Software in RISC- V Soft Processor.

[BibT_eX]

[DOI]

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit.

[BibT_eX]

[DOI]

Proceedings of the 18th IEEE International New Circuits and Systems Conference, 2020

In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops.

[BibT_eX]

[DOI]

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

An Emulation Platform for Evaluating the Reliability of Deep Neural Networks.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

On the Evaluation of SEU Effects on AXI Interconnect Within AP-SoCs.

[BibT_eX]

[DOI]

Proceedings of the Architecture of Computing Systems - ARCS 2020, 2020

2019

Analyzing Radiation-Induced Transient Errors on SRAM-Based FPGAs by Propagation of Broadening Effect.

[BibT_eX]

[DOI]

IEEE Access, 2019

A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs.

[BibT_eX]

[DOI]

Proceedings of the 16th International Conference on Synthesis, 2019

On the Evaluation of the PIPB Effect within SRAM-based FPGAs.

[BibT_eX]

[DOI]