Corinne Bestory

According to our database, Corinne Bestory authored at least 4 papers between 2004 and 2009.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2009

Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror.

Corinne Bestory, François Marc, S. Duzellier, Hervé Levi

Microelectron. Reliab., 2009

2007

Statistical analysis during the reliability simulation.

Corinne Bestory, François Marc, Hervé Levi

Microelectron. Reliab., 2007

2006

Multi-level Modeling of Hot Carrier Injection for Reliability.

Corinne Bestory, François Marc, Hervé Levi, Yves Danto

Proceedings of the Forum on specification and Design Languages, 2006

2004

Study of the ESD defects impact on ICs reliability.

Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis

Microelectron. Reliab., 2004