Corinna Kofler
Orcid: 0000-0003-4056-2617
According to our database1,
Corinna Kofler
authored at least 5 papers
between 2017 and 2022.
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Bibliography
2022
Detection of Unknown Defects in Semiconductor Materials from a Hybrid Deep and Machine Learning Approach.
Proceedings of the Bio-inspired Systems and Applications: from Robotics to Ambient Intelligence, 2022
Data-Centric Model Development to Improve the CNN Classification of Defect Density SEM Images.
Proceedings of the IECON 2022, 2022
2019
Classifying Image Stacks of Specular Silicon Wafer Back Surface Regions: Performance Comparison of CNNs and SVMs.
Sensors, 2019
2018
Detecting Star Cracks in Topography Images of Specular Back Surfaces of Structured Wafers.
Proceedings of the 17th IEEE International Conference on Machine Learning and Applications, 2018
2017
Proceedings of the 2017 Winter Simulation Conference, 2017