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Cong Pan

Orcid: 0000-0002-4955-7761

Affiliations:
  • China Electronics Product Reliability and Environmental Testing Research Institute, China
  • Beihang University, China (former)


According to our database1, Cong Pan authored at least 3 papers between 2018 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

2018
2019
2020
2021
2022
2023
0
1
2
1
1
1

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

Online presence:

On csauthors.net:

Bibliography

2023
A Framework of Operational Profile for AI Systems.
[BibTeX]
[DOI]
Cong Pan
,
Ai Gu
,
Yan Gao
Proceedings of the 2023 International Conference on Information Education and Artificial Intelligence, 2023

2021
Continuous test suite failure prediction.
[BibTeX]
[DOI]
Cong Pan
,
Michael Pradel
Proceedings of the ISSTA '21: 30th ACM SIGSOFT International Symposium on Software Testing and Analysis, 2021

2018
Qualitative Software Reliability Requirements: Concept, Classification and Practical Elicitation Methods.
[BibTeX]
[DOI]
Cong Pan
,
Minyan Lu
,
Hong Zhang
,
Biao Xu
Proceedings of the 2018 IEEE International Conference on Software Quality, 2018


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