Cong Pan
Orcid: 0000-0002-4955-7761Affiliations:
- China Electronics Product Reliability and Environmental Testing Research Institute, China
- Beihang University, China (former)
According to our database1,
Cong Pan
authored at least 3 papers
between 2018 and 2023.
Collaborative distances:
Collaborative distances:
Timeline
2018
2019
2020
2021
2022
2023
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Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
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on orcid.org
On csauthors.net:
Bibliography
2023
Proceedings of the 2023 International Conference on Information Education and Artificial Intelligence, 2023
2021
Proceedings of the ISSTA '21: 30th ACM SIGSOFT International Symposium on Software Testing and Analysis, 2021
2018
Qualitative Software Reliability Requirements: Concept, Classification and Practical Elicitation Methods.
Proceedings of the 2018 IEEE International Conference on Software Quality, 2018