Colin M. Maunder

According to our database, Colin M. Maunder authored at least 15 papers between 1983 and 1999.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1999

Test: shared problems and shared solutions.

Colin Maunder

IEEE Commun. Mag., 1999

1998

The Future: Plug and Pray?

Colin M. Maunder

IEEE Des. Test Comput., 1998

1997

Plug and Play or Plug and Pray: We Have a Right to Know It Will Work (Or Why It Won't).

Colin M. Maunder

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1994

Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution.

Alfred L. Crouch, Rick Ramus, Colin M. Maunder

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

Testability on TAP.

Colin M. Maunder, Rodham E. Tulloss

Microprocess. Microsystems, 1993

Boundary-scan testing.

Colin Maunder

Microprocess. Microsystems, 1993

Position Statement: ITC93 Boundary-Scan Panel.

Colin M. Maunder

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

A Universal Framework for Managed Built-in Test.

Colin M. Maunder

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

A D&T Special Report-Boundary Scan: An End-of-Term Report-IEEE Std 1149.1 Survey Results.

Colin M. Maunder

IEEE Des. Test Comput., 1992

1991

An introduction to the boundary scan standard: ANSI/IEEE Std 1149.1.

Colin M. Maunder, Rodham E. Tulloss

J. Electron. Test., 1991

Languages to Support Boundary-Scan Test.

Colin M. Maunder

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1989

Built-in test for VLSI - pseudorandom techniques: Bardell, P H, McArney, W H and Savir, J Wiley, New York, NY, USA (1987) £45.00 pp 354.

Colin Maunder

Microprocess. Microsystems, 1989

1987

Bargain for testability researchers: Tsui, F FLSI/VLSI testability design McGrawHill, New York, NY, USA (1987) £49.95 pp 702.

Colin Maunder

Microprocess. Microsystems, 1987

1986

Digital logic testing and simulation: Alexander Miczo Harper and Row, Plymouth, UK (1986) £24.95 pp 141.

Colin Maunder

Microprocess. Microsystems, 1986

1983

HITEST Test Generation System Interfaces.

Colin M. Maunder

Proceedings of the Proceedings International Test Conference 1983, 1983