Clement Merckling
Orcid: 0000-0003-3084-2543
According to our database1,
Clement Merckling
authored at least 2 papers
between 2007 and 2024.
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Bibliography
2024
Physics-informed machine learning to analyze oxide defect-induced RTN in gate leakage current.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2007
Microelectron. Reliab., 2007