Clemens Mart
Orcid: 0000-0002-1828-2187
According to our database1,
Clemens Mart
authored at least 4 papers
between 2018 and 2022.
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Bibliography
2022
Reliability of Ferroelectric and Antiferroelectric Si: HfO2 materials in 3D capacitors by TDDB studies.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2020
Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Proceedings of the 49th European Solid-State Device Research Conference, 2019
2018
CMOS Compatible Pyroelectric Applications Enabled by Doped HfO2 Films on Deep-Trench Structures.
Proceedings of the 48th European Solid-State Device Research Conference, 2018