Claudio Lanzieri

According to our database, Claudio Lanzieri authored at least 7 papers between 2008 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2015

Effects of buffer compensation strategies on the electrical performance and RF reliability of AlGaN/GaN HEMTs.

Davide Bisi, Antonio Stocco, Isabella Rossetto, Matteo Meneghini, Fabiana Rampazzo, Alessandro Chini, Fabio Soci, Alessio Pantellini, Claudio Lanzieri, Piero Gamarra, Cedric Lacam, M. Tordjman, Marie-Antoinette di Forte-Poisson, Davide De Salvador, Marco Bazzan, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2015

2014

Reliability Investigation of GaN HEMTs for MMICs Applications.

Alessandro Chini, Gaudenzio Meneghesso, Alessio Pantellini, Claudio Lanzieri, Enrico Zanoni

Micromachines, 2014

2013

Impact of field-plate geometry on the reliability of GaN-on-SiC HEMTs.

Alessandro Chini, Fabio Soci, Fausto Fantini, A. Nanni, A. Pantellini, Claudio Lanzieri, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2013

Influence of fluorine-based dry etching on electrical parameters of AlGaN/GaN-on-Si High Electron Mobility Transistors.

Davide Bisi, Matteo Meneghini, Antonio Stocco, Giulia Cibin, Alessio Pantellini, Antonio Nanni, Claudio Lanzieri, Enrico Zanoni, Gaudenzio Meneghesso

Proceedings of the European Solid-State Device Research Conference, 2013

2012

Field plate related reliability improvements in GaN-on-Si HEMTs.

Alessandro Chini, Fabio Soci, Fausto Fantini, Antonio Nanni, Alessio Pantellini, Claudio Lanzieri, Davide Bisi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2012

2011

Electro-thermal characterization of AlGaN/GaN HEMT on Silicon Microstrip Technology.

Michele Riccio, A. Pantellini, Andrea Irace, Giovanni Breglio, A. Nanni, Claudio Lanzieri

Microelectron. Reliab., 2011

2008

Thermal storage effects on AlGaN/GaN HEMT.

Francesca Danesin, Augusto Tazzoli, Franco Zanon, Gaudenzio Meneghesso, Enrico Zanoni, Antonio Cetronio, Claudio Lanzieri, Simone Lavanga, Marco Peroni, Paolo Romanini

Microelectron. Reliab., 2008