Chunlin Lv

Orcid: 0000-0002-9395-0819

According to our database¹, Chunlin Lv authored at least 3 papers between 2020 and 2023.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

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Bibliography

2023

A Method to Characterize the Shrinking of Safe Operation Area of Metallized Film Capacitor Considering Electrothermal Coupling and Aging in Power Electronics Applications.

[BibT_eX]

[DOI]

IEEE Trans. Ind. Electron., 2023

2022

Capacitor Lifetime-Based Power Routing of ISOP-DAB Converter Within Comprehensive Constraint.

[BibT_eX]

[DOI]

IEEE Trans. Ind. Electron., 2022

2020

Reliability Analysis and Design of MMC Based on Mission Profile for the Components Degradation.

[BibT_eX]

[DOI]

IEEE Access, 2020

Chunlin Lv

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