ChunHsi Li

According to our database, ChunHsi Li authored at least 8 papers between 2005 and 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2011

Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection.

ChunHsi Li, Chuan-Yu Chang, MuDer Jeng

IEEE Trans. Syst. Man Cybern. Part C, 2011

Wafer defect inspection by neural analysis of region features.

Chuan-Yu Chang, ChunHsi Li, Yung-Chi Chang, MuDer Jeng

J. Intell. Manuf., 2011

2010

A case study of applying regional level-set formulation to post-sawing LED wafer inspection.

ChunHsi Li, Chuan-Yu Chang, MuDer Jeng, Yang-Ting Jeng

Proceedings of the IEEE International Conference on Systems, 2010

2009

Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection.

Chuan-Yu Chang, ChunHsi Li, Si-Yan Lin, MuDer Jeng

IEEE Trans. Syst. Man Cybern. Part C, 2009

An unsupervised neural network approach for automatic semiconductor wafer defect inspection.

Chuan-Yu Chang, ChunHsi Li, Jia-Wei Chang, MuDer Jeng

Expert Syst. Appl., 2009

Automatic Die Inspection for Post-sawing LED Wafers.

Chuan-Yu Chang, Yung-Chi Chang, ChunHsi Li, MuDer Jeng

Proceedings of the IEEE International Conference on Systems, 2009

2006

Diagnosability Enhancement of Discrete Event Systems.

YuanLin Wen, ChunHsi Li, MuDer Jeng

Proceedings of the IEEE International Conference on Systems, 2006

2005

A polynomial algorithm for checking diagnosability of Petri nets.

YuanLin Wen, ChunHsi Li, MuDer Jeng

Proceedings of the IEEE International Conference on Systems, 2005