Chung W. See
According to our database1,
Chung W. See
authored at least 2 papers
between 2001 and 2004.
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Bibliography
2004
Sub-pixel image correlation: an alternative to SAM and dye penetrant for crack detection and mechanical stress localisation in semiconductor packages.
Microelectron. Reliab., 2004
2001
Proceedings of the 2001 International Conference on Image Processing, 2001