Chun-Kai Hsu
According to our database1,
Chun-Kai Hsu
authored at least 10 papers
between 2008 and 2016.
Collaborative distances:
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Bibliography
2016
Test Data Analytics: Exploration of Hidden Patterns for Test Cost Reduction and Silicon Characterization
PhD thesis, 2016
Variation and failure characterization through pattern classification of test data from multiple test stages.
Proceedings of the 2016 IEEE International Test Conference, 2016
2015
Proceedings of the 2015 IEEE International Test Conference, 2015
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015
2014
Feature engineering with canonical analysis for effective statistical tests screening test escapes.
Proceedings of the 2014 International Test Conference, 2014
Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014
Proceedings of the 23rd IEEE Asian Test Symposium, 2014
2013
Test data analytics - Exploring spatial and test-item correlations in production test data.
Proceedings of the 2013 IEEE International Test Conference, 2013
Proceedings of the 18th Asia and South Pacific Design Automation Conference, 2013
2008
Area and Test Cost Reduction for On-Chip Wireless Test Channels with System-Level Design Techniques.
Proceedings of the 17th IEEE Asian Test Symposium, 2008