Chun-Kai Hsu

According to our database1, Chun-Kai Hsu authored at least 10 papers between 2008 and 2016.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2016
Test Data Analytics: Exploration of Hidden Patterns for Test Cost Reduction and Silicon Characterization
PhD thesis, 2016

Variation and failure characterization through pattern classification of test data from multiple test stages.
Proceedings of the 2016 IEEE International Test Conference, 2016

2015
AdaTest: An efficient statistical test framework for test escape screening.
Proceedings of the 2015 IEEE International Test Conference, 2015

Pairwise Proximity-Based Features for Test Escape Screening.
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015

2014
Feature engineering with canonical analysis for effective statistical tests screening test escapes.
Proceedings of the 2014 International Test Conference, 2014

Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Learning from Production Test Data: Correlation Exploration and Feature Engineering.
Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013
Test data analytics - Exploring spatial and test-item correlations in production test data.
Proceedings of the 2013 IEEE International Test Conference, 2013

Processor and DRAM integration by TSV-based 3-D stacking for power-aware SOCs.
Proceedings of the 18th Asia and South Pacific Design Automation Conference, 2013

2008
Area and Test Cost Reduction for On-Chip Wireless Test Channels with System-Level Design Techniques.
Proceedings of the 17th IEEE Asian Test Symposium, 2008


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