Christopher Münch

According to our database, Christopher Münch authored at least 31 papers between 2018 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

The research landscape around the physical internet - a bibliometric analysis.

Christopher Münch, Manuel Wehrle, Tobias Kuhn, Evi Hartmann

Int. J. Prod. Res., March, 2024

Design-time Reference Current Generation for Robust Spintronic-based Neuromorphic Architecture.

Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori

ACM J. Emerg. Technol. Comput. Syst., January, 2024

Building Resilience Through Foresight: The Case of Maritime Container Shipping Firms.

Henrik Bathke, Christopher Münch, Heiko A. von der Gracht, Evi Hartmann

IEEE Trans. Engineering Management, 2024

From Occasional to Active Crowdshippers: The Significance of Couriers' Characteristics.

Henrik Bathke, Christopher Münch

IEEE Trans. Engineering Management, 2024

MBIST-based weak bit screening method for embedded MRAM.

Jongsin Yun, Sina Bakhtavari Mamaghani, Mehdi B. Tahoori, Christopher Münch, Martin Keim

Proceedings of the IEEE European Test Symposium, 2024

Algorithm to Technology Co-Optimization for CiM-Based Hyperdimensional Computing.

Mahta Mayahinia, Simon Thomann, Paul R. Genssler, Christopher Münch, Hussam Amrouch, Mehdi B. Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

2023

How digital transformation impacts organizational culture - A multi-hierarchical perspective on the manufacturing sector.

Yuko Melanie Pfaff, Annika Judith Wohlleber, Christopher Münch, Christoph Küffner, Evi Hartmann

Comput. Ind. Eng., September, 2023

NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories.

Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., May, 2023

Timing-accurate simulation framework for NVM-based compute-in-memory architecture exploration.

Vincent Rietz, Christopher Münch, Mahta Mayahinia, Mehdi Baradaran Tahoori

it Inf. Technol., May, 2023

Transforming resilience in the context of a pandemic: results from a cross-industry case study exploring supply chain viability.

Christopher Münch, Evi Hartmann

Int. J. Prod. Res., April, 2023

SpinDrop: Dropout-Based Bayesian Binary Neural Networks With Spintronic Implementation.

Soyed Tuhin Ahmed, Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori

IEEE J. Emerg. Sel. Topics Circuits Syst., March, 2023

Design and Test of Spintronic Compute-in-Memory Architectures

Christopher Münch

PhD thesis, 2023

A Low Overhead Checksum Technique for Error Correction in Memristive Crossbar for Deep Learning Applications.

Surendra Hemaram, Soyed Tuhin Ahmed, Mahta Mayahinia, Christopher Münch, Mehdi B. Tahoori

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

Smart Hammering: A practical method of pinhole detection in MRAM memories.

Sina Bakhtavari Mamaghani, Christopher Münch, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

Automatic Test Pattern Generation and Compaction for Deep Neural Networks.

Dina A. Moussa, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori

Proceedings of the 28th Asia and South Pacific Design Automation Conference, 2023

2022

MBIST-based Trim-Search Test Time Reduction for STT-MRAM.

Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Special Session: STT-MRAMs: Technology, Design and Test.

Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Binary Bayesian Neural Networks for Efficient Uncertainty Estimation Leveraging Inherent Stochasticity of Spintronic Devices.

Soyed Tuhin Ahmed, Kamal Danouchi, Christopher Münch, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori

Proceedings of the 17th ACM International Symposium on Nanoscale Architectures, 2022

PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory.

Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori

Proceedings of the IEEE European Test Symposium, 2022

Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric.

Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori

Proceedings of the IEEE European Test Symposium, 2022

MVSTT: A Multi-Value Computation-in-Memory based on Spin-Transfer Torque Memories.

Atousa Jafari, Mahta Mayahinia, Soyed Tuhin Ahmed, Christopher Münch, Mehdi B. Tahoori

Proceedings of the 25th Euromicro Conference on Digital System Design, 2022

2021

Analyzing and Mitigating Sensing Failures in Spintronic-based Computing in Memory.

Mahta Mayahinia, Christopher Münch, Mehdi B. Tahoori

Proceedings of the IEEE International Test Conference, 2021

MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM.

Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori

Proceedings of the 26th IEEE European Test Symposium, 2021

NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories.

Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori

Proceedings of the 26th IEEE European Test Symposium, 2021

Testing Resistive Memory based Neuromorphic Architectures using Reference Trimming.

Christopher Münch, Mehdi B. Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis.

Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Defect Characterization of Spintronic-based Neuromorphic Circuits.

Christopher Münch, Mehdi B. Tahoori

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory.

Sarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori

Proceedings of the IEEE European Test Symposium, 2020

Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive Memories.

Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

2019

Reliable in-memory neuromorphic computing using spintronics.

Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori

Proceedings of the 24th Asia and South Pacific Design Automation Conference, 2019

2018

Multi-bit non-volatile spintronic flip-flop.

Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018