Christopher L. Henderson

According to our database, Christopher L. Henderson authored at least 9 papers between 1991 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2013

Failure analysis techniques for a 3D world.

Christopher L. Henderson

Microelectron. Reliab., 2013

1997

Still in the Stone Age?

Jerry M. Soden, Christopher L. Henderson

IEEE Des. Test Comput., 1997

IC Failure Analysis: Magic, Mystery, and Science.

Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson

IEEE Des. Test Comput., 1997

IC Diagnosis: Industry Issues.

Jerry M. Soden, Christopher L. Henderson

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Signature Analysis for IC Diagnosis and Failure Analysis.

Christopher L. Henderson, Jerry M. Soden

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Transient Power Supply Voltage (V_DDT) Analysis for Detecting IC Defects.

Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science.

Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1992

Economic Impact of Type I Test Errors at System and Board Levels.

Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991

The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits.

Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991