Christopher Frost

According to our database, Christopher Frost authored at least 16 papers between 2012 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2024

Single Event Effects Assessment of UltraScale+ MPSoC Systems Under Atmospheric Radiation.

Dimitris Agiakatsikas, Nikos Foutris, Aitzan Sari, Vasileios Vlagkoulis, Ioanna Souvatzoglou, Mihalis Psarakis, Ruiqi Ye, John Goodacre, Mikel Luján, Maria Kastriotou, Carlo Cazzaniga, Chris Frost

IEEE Trans. Reliab., March, 2024

2023

Irradiation Tests for Commercial Off-the Shelf Components with Atmospheric-like Neutrons and Heavy-Ions.

Paolo Branchini, Andrea Fabbri, Sacha Cormenier, Marco Bernardini, Giovanni Romanelli, Enrico Preziosi, Roberto Senesi, Carla Andreani, Chris Frost, Carlo Cazzaniga, Toni Fabio Catalano, Mario Buffardo

CoRR, 2023

2021

Thermal neutrons: a possible threat for supercomputer reliability.

Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando Fernandes dos Santos, Gabriel Piscoya Dávila, Philippe O. A. Navaux, Andrea Favalli, Opale Schappert, Stephen Wender, Carlo Cazzaniga, Christopher Frost, Paolo Rech

J. Supercomput., 2021

First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics.

Carlo Cazzaniga, Marta Bagatin, Simone Gerardin, Alessandra Costantino, Christopher D. Frost

IEEE Trans. Emerg. Top. Comput., 2021

Experimental Findings on the Sources of Detected Unrecoverable Errors in GPUs.

Fernando Fernandes dos Santos, Sujit Malde, Carlo Cazzaniga, Christopher Frost, Luigi Carro, Paolo Rech

CoRR, 2021

2020

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node.

Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications.

Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando Fernandes dos Santos, Gabriel Piscoya Dávila, Philippe O. A. Navaux, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech

Proceedings of the IEEE European Test Symposium, 2020

An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices.

Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fermando Santos, Gabriel Piscoya Dávila, Philippe Olivier Alexandre Navaux, Stephen Wender, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech

Proceedings of the 50th Annual IEEE-IFIP International Conference on Dependable Systems and Networks, 2020

2015

Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects.

Lucas A. Tambara, Felipe Almeida, Paolo Rech, Fernanda Lima Kastensmidt, Giovanni Bruni, Christopher Frost

Proceedings of the Applied Reconfigurable Computing - 11th International Symposium, 2015

2014

Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs.

Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost

Microelectron. Reliab., 2014

GPUs Neutron Sensitivity Dependence on Data Type.

Paolo Rech, Christopher Frost, Luigi Carro

J. Electron. Test., 2014

Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs.

Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost

Proceedings of the 19th IEEE European Test Symposium, 2014

Decreasing FIT with diverse triple modular redundancy in SRAM-based FPGAs.

Lucas A. Tambara, Fernanda Lima Kastensmidt, Paolo Rech, Christopher Frost

Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014

2013

Neutron sensitivity of integer and floating point operations executed in GPUs.

Paolo Rech, Caroline Aguiar, Christopher Frost, Luigi Carro

Proceedings of the 14th Latin American Test Workshop, 2013

Experimental evaluation of thread distribution effects on multiple output errors in GPUs.

Paolo Rech, Caroline Aguiar, Christopher Frost, Luigi Carro

Proceedings of the 18th IEEE European Test Symposium, 2013

2012

Neutron radiation test of graphic processing units.

Paolo Rech, Caroline Aguiar, Ronaldo Rodrigues Ferreira, Christopher Frost, Luigi Carro

Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012