Christoph Weimer
Orcid: 0000-0002-6005-0937
According to our database1,
Christoph Weimer
authored at least 7 papers
between 2020 and 2023.
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Bibliography
2023
Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023
Numerical Device Simulation Aided Study of RF-Stress-Caused Degradation in SiGe HBTs.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2023
2022
Characterization of Dynamic Large-Signal Operating Limits and Long-Term RF Reliability of SiGe HBTs.
Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022
Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022
2021
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021
2020
Modeling the temperature dependence of sheet and contact resistances in SiGe: C HBTs from 4.3 to 423 K.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2020