Christoph Weimer

Orcid: 0000-0002-6005-0937

According to our database1, Christoph Weimer authored at least 7 papers between 2020 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

On csauthors.net:

Bibliography

2023
Nonlinear Compact Modeling of InP/InGaAs DHBTs with HICUM/L2.
Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

Numerical Device Simulation Aided Study of RF-Stress-Caused Degradation in SiGe HBTs.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2023

2022
Characterization of Dynamic Large-Signal Operating Limits and Long-Term RF Reliability of SiGe HBTs.
Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022

Thermal impedance of SiGe HBTs: Characterization and modeling.
Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022

2021
An Experimental Load-Pull Based Large-Signal RF Reliability Study of SiGe HBTs.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021

Augmented Drift-Diffusion Transport for the Simulation of Advanced SiGe HBTs.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021

2020
Modeling the temperature dependence of sheet and contact resistances in SiGe: C HBTs from 4.3 to 423 K.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2020


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