Christoph Kerner
According to our database1,
Christoph Kerner
authored at least 3 papers
between 2007 and 2012.
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Bibliography
2012
Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012
2009
Proceedings of the 35th European Solid-State Circuits Conference, 2009
2007
Optimization of HfSiON using a design of experiment (DOE) approach on 0.45 V V<sub>t</sub> Ni-FUSI CMOS transistors.
Microelectron. Reliab., 2007