Christoforos G. Theodorou

According to our database, Christoforos G. Theodorou authored at least 16 papers between 2009 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Breakthrough Processes for Si CMOS Devices with BEOL Compatibility for 3D Sequential Integrated more than Moore Analog Applications.

Daphnée Bosch, Abygaël Viey, Tadeu Mota Frutuoso, P. Lheritier, C. Licitra, Nada Zerhouni, A. Albouy, Laurent Brunet, A. Magalhaes-Lucas, L. M. B. da Silva, H. Boutry, M. Husien Fahmy Taha Abdelrahman, F. Cristiano, R. Gassilloud, M. Ribotta, G. Romano, William Vandendaele, V. Benevent, M. Opprecht, S. Kerdilès, F. Milesi, F. Mazen, Benoit Sklénard, C. Euvrard-Colnat, Johannes Sturm, A. Lambert, C. Candebage, L. Laraignou, F. Boulard, A. Sarrazin, M. De Souza, Christoforos G. Theodorou, Xavier Garros, Perrine Batude

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

2023

Experimental Study of Self-Heating Effect in InGaAs HEMTs for Quantum Technologies Down to 10K.

F. Serra Di Santa Maria, Francis Balestra, Christoforos G. Theodorou, Gérard Ghibaudo, Cezar B. Zota, Eunjung Cha

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Accounting for Current Degradation Effects in the Compact Noise Modeling of Nano-scale MOSFETs.

Angeliki Tataridou, Christoforos G. Theodorou

Proceedings of the 11th International Conference on Modern Circuits and Systems Technologies, 2022

In-depth electrical characterization of deca-nanometer InGaAs MOSFET down to cryogenic temperatures for low-power quantum applications.

F. Serra Di Santa Maria, Christoforos G. Theodorou, Francis Balestra, Gérard Ghibaudo, Eunjung Cha, Cezar B. Zota

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2021

Inter-tier Coupling Analysis in Back-illuminated Monolithic 3DSI Image Sensor Pixels.

Petros Sideris, Arnaud Peizerat, Perrine Batude, Christoforos G. Theodorou, Gilles Sicard

Proceedings of the 10th International Conference on Modern Circuits and Systems Technologies, 2021

"Pinch to Detect": A Method to Increase the Number of Detectable RTN Traps in Nano-scale MOSFETs.

Angeliki Tataridou, Gérard Ghibaudo, Christoforos G. Theodorou

Proceedings of the IEEE International Reliability Physics Symposium, 2021

VERILOR: A Verilog-A Model of Lorentzian Spectra for Simulating Trap-related Noise in CMOS Circuits.

Angeliki Tataridou, Gérard Ghibaudo, Christoforos G. Theodorou

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021

2018

1/f Noise Characterization of Piezoresistive Nano-Gauges for MEMS Sensors.

Antoine Nowodzinski, Dihia Sidi Ahmed, Christoforos G. Theodorou, Alexandra Kournela, Hélène Duchemin, Cyril Dressler, Audrey Berthelot, Hélène Lhermer

Proceedings of the 2018 IEEE SENSORS, New Delhi, India, October 28-31, 2018, 2018

Static and Low Frequency Noise Characterization of InGaAs MOSFETs and FinFETs on Insulator.

Theano A. Karatsori, K. Bennamane, Christoforos G. Theodorou, L. Czornomaz, Jean Fompeyrine, Cezar B. Zota, Clarissa Convertino, Gérard Ghibaudo

Proceedings of the 48th European Solid-State Device Research Conference, 2018

2016

Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators.

Ioannis Messaris, Theano A. Karatsori, Nikolaos Fasarakis, Christoforos G. Theodorou, Spiros Nikolaidis, Gérard Ghibaudo, C. A. Dimitriadis

Microelectron. Reliab., 2016

Noise-induced dynamic variability in nano-scale CMOS SRAM cells.

Christoforos G. Theodorou, Mouenes Fadlallah, Xavier Garros, Charalambos A. Dimitriadis, Gérard Ghibaudo

Proceedings of the 46th European Solid-State Device Research Conference, 2016

Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs.

R. Lavieville, Theano A. Karatsori, Christoforos G. Theodorou, Sylvain Barraud, C. A. Dimitriadis, Gérard Ghibaudo

Proceedings of the 46th European Solid-State Device Research Conference, 2016

2015

New LFN and RTN analysis methodology in 28 and 14nm FD-SOI MOSFETs.

Christoforos G. Theodorou, Eleftherios G. Ioannidis, Sébastien Haendler, Nicolas Planes, Emmanuel Josse, Charalambos A. Dimitriadis, Gérard Ghibaudo

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs.

Eleftherios G. Ioannidis, Sébastien Haendler, Christoforos G. Theodorou, Nicolas Planes, Charalabos A. Dimitriadis, Gérard Ghibaudo

Proceedings of the 44th European Solid State Device Research Conference, 2014

2012

Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs.

Christoforos G. Theodorou, Eleftherios G. Ioannidis, Sébastien Haendler, Nicolas Planes, Franck Arnaud, Jalal Jomaah, Charalambos A. Dimitriadis, Gérard Ghibaudo

Proceedings of the 2012 European Solid-State Device Research Conference, 2012

2009

A new linear voltage-to-current converter with threshold voltage compensation for analog circuits applications in polycrystalline silicon TFT process.

Ilias Pappas, Christoforos G. Theodorou, Stylianos Siskos, Charalambos A. Dimitriadis

Proceedings of the 16th IEEE International Conference on Electronics, 2009